| S | |||
| S-MIME | Secure MIME | ||
| S/N | Signal to Noise Ratio | ||
| S/PDIF | Sony/Philips Digital Interface | ||
| S | Sulfur | ||
| SA | Surface area; Subresolution assist; Structured analysis | ||
| S/A | Sensor/actuator | ||
| SAA | Static automated analysis | ||
| SAB | Sensor/actuator bus | ||
| SACD | Super Audio CD | ||
| SAD | Selected Area Diffraction | ||
| SAE | Society of Automotive Engineers | ||
| SAED | Selected Area Electron Diffraction | ||
| SAG | Self Aligned Gate | ||
| SAGA | Standards und Architekturen für e-Government Anwendungen | ||
| SAM | Scanning Auger Microscopy | ||
| SAN | Storage Area Network | ||
| SANS | Small Angle Neutron Scattering | ||
| SAR | Successive Approximation Register; Synthetic Aperture Radar | ||
| SARE | Segmentation And Reassembly Element | ||
| SAS | Suspended Air Stripline | ||
| SAT | Spray acid tool | ||
| SAW | Surface-Acoustic Wave | ||
| SAX | Simple API for XML | ||
| SAXS | Small Angle X-ray Scattering | ||
| Sb | Antimony | ||
| SB | Strong base ion exchange | ||
| SBC | S Bus Circuit | ||
| SBC-X | S Bus Circuit Extended | ||
| SBD | Schottky Barrier Diode | ||
| SBL | Scanned Beam Laminography | ||
| SBT | Slender Body Theory | ||
| SBU | Sequential build-up | ||
| Sc | Scandium | ||
| SC | Semi-Conducting; Short Circuit | ||
| SC1 | Standard Clean 1 | ||
| SC2 | Standard Clean 2 | ||
| SCA | Surface charge analysis | ||
| SCALPEL | Scattering with Angular Limitation in Projection Electron-beam Lithography | ||
| SCART | European connector definition for TVs and VCRs | ||
| SCBA | Self-contained breathing apparatus | ||
| SCC | Strategic cell controller | ||
| SCCS | Source code control system | ||
| SCE | Saturated calomel electrode | ||
| SCF | Super critical fluid | ||
| SCI | Surface charge imaging | ||
| SCIC | Semiconductor integrated circuit | ||
| SCM | Scanning capacitance microscopy | ||
| SCNT | Single Chip Network Termination | ||
| SCP | Single chip package | ||
| SCR | Silicon controlled rectifier | ||
| SCS | Single Crystal Silicon | ||
| SCSI | Small Computer System Interface (pronounced 'sku-zi') | ||
| SCT | SciTex continuous tone image format | ||
| SCTE | Society of Telecommunications Engineers | ||
| SD | Small dual in-line package; structured design; single density | ||
| S/D | Source/drain | ||
| SDFL | Schottky-diode FET logic | ||
| SDH | Synchronous Digital Hierarchy | ||
| SDHT | Selectively Doped Heterojunction Transistor; SDH/SONET Transceiver | ||
| SDLC | Synchronous data link control | ||
| SDLTS | Scanning Deep-Level Transient Spectroscopy | ||
| SDM | Specific Device Model for SAB | ||
| SDMI | Secure Digital Music Initiative | ||
| SDR | Software Defined Radio | ||
| SDRAM | Synchronous Dynamic Random Access Memory | ||
| SDS | Smart distributed system | ||
| SDSI | Synchronous data-link control | ||
| Se | Selenium | ||
| SE | Spectroscopic ellipsometry; secondary electron; Seed End; Surface Element | ||
| SEAJ | Semiconductor Equipment Association of Japan | ||
| SEC | Size exclusion chromatography; Solvent extract conductivity | ||
| SECAM | Systeme čn Coleur Avec Mémoire (european TV system) | ||
| SECS | Semiconductor Equipment Communications Standard | ||
| SEDOR | Spin Echo DOuble Resonance | ||
| SEG | Selective epitaxial growth | ||
| SEIM | Software engineering improvement method | ||
| SEL | Surface Emitting Laser | ||
| SEM | Scanning Electron Microscopy; Specific Equipment Model; Standard Electronic Module | ||
| SEMI | Semiconductor Equipment and Materials International | ||
| SEMISPIN | Semiconductor Software Process Improvement Network | ||
| SEP | Software engineering process | ||
| SEPG | Software Engineering Process Group | ||
| SEQDB | Semiconductor Equipment Database | ||
| SERA | Sequential Electrochemical Reduction Analysis | ||
| SERDES | Serialization/Deserialization | ||
| SES | Secondary Electron Spectroscopy | ||
| SET | Single Electron Tunneling/TransPort | ||
| SETEC | Semiconductor Equipment Technology Center | ||
| SEXAFS | Surface Extended X-ray Absorption Fine Structure | ||
| SF | Super Fluorescence | ||
| SFB | Symmetry Breaking Force | ||
| SFC | Supercritical fluid chromatography | ||
| SFCS | Shop floor control system | ||
| SFCSI/F | Shop floor control system interface | ||
| SFD | Stacking Fault Density | ||
| SFDR | Spurious Free Dynamic Range | ||
| SFG | Sum Frequency Generation | ||
| SFM | Surface feet per minute | ||
| SFTPS | Secure File Transfer Protocol | ||
| Sg | Seaborgium | ||
| SGML | Standard Generalized Markup Language | ||
| SGMM | Semiconductor Generic Manufacturing Model | ||
| SGMRS | Semiconductor Generic Manufacturing Requirements Specification | ||
| SGRAM | Synchronous Graphics Random Access Memory | ||
| SGV | Scalable Vector Graphics | ||
| SHA | Secure Hash Algorithm | ||
| SHAC | Simple Hands-free Add-on Circuit | ||
| SHARC | Super Harvard Architecture Computer | ||
| SHESQUID | SQUID of brand "SHE" | ||
| SHF | Super HyperFine (interaction) | ||
| SHG | Second Harmonic Generation | ||
| Si | Silicon | ||
| SI | Semi-Insulating; Service Information | ||
| SIA | Semiconductor Industry Association | ||
| SiC | Silicon Carbide | ||
| SICAT | Siemens Concept Analog Telephone | ||
| SICOFI | Signalling Codec Filter | ||
| SIDP | Sputter ion depth profiling | ||
| SiGe | Silicon Germanium | ||
| SiH4 | Silane | ||
| SIL | Systems Integration Lab (was ATF) | ||
| SIMO | Single input, multi output | ||
| SIMOX | Separation by implantation of oxygen | ||
| SIMS | Secondary Ion Mass Spectroscopy | ||
| SIO | Serial Input Output | ||
| SIOA | Surface Induced Optical Anisotropy | ||
| SIP | Single Inline Package; Session Initiation Protocol | ||
| SIPO | Serial In Parallel output | ||
| SIR | Surface Insulation Resistance | ||
| SIRIJ | Semiconductor Industry Research Institute of Japan | ||
| SISFET | Semiconductor-Insulator-Semiconductor FET | ||
| SISO | Single input, single output; Serial in serial out | ||
| SIT | Static Induction Transistor, System Interface Test | ||
| SIV | Sensors in vacuum | ||
| SL | Specification limit; Super lattice | ||
| SLAC | Subscriber Line Audio processing interface | ||
| SLAM | Scanning laser acoustic microscopy; Single layer alumina metallization | ||
| SLC | Surface Laminar Circuit; Single Layer Cap | ||
| SLD | Strong Lattice Deformation | ||
| SLEED | Spin-Polarized Low Energy Electron Diffraction (aka SPLEED) | ||
| SLIC | Standard-function Linear Integrated Circuit; Subscriber Line Interface Circuit | ||
| SLICOFI | Subscriber Line Interface Circuit and Signaling Codec Filter | ||
| SLIP | Single Line Internet Protocol | ||
| SLM | Spatial Light Modulator | ||
| SLOC | Source lines of code | ||
| SLPSS | Semiconductor Laser Pumped Solid State (laser source) | ||
| SLR | Small Lattice Relaxation | ||
| SLS | Strained Layer SL | ||
| SLSI | Super large scale integration | ||
| Sm | Samarium | ||
| SM | Stress migration; Surface mount | ||
| SMA | Shape Memory Alloy; Surface Mount Assembly; Sub-Miniature type A | ||
| SMB | Single-mask bumping | ||
| SMC | Surface-mounted components | ||
| SMD | Surface Mount Devices | ||
| SME | Subject matter expert; Software maintenance engineer | ||
| SMEMA | Surface Mount Equipment Manufacturers Association | ||
| SMG | Screen management guide | ||
| SMID | Single Instruction Multiple Data | ||
| SMIF | Standard mechanical interface | ||
| SMIL | Synchronized Multi-media Integration Language | ||
| SMOBC | Solder mask over bare copper | ||
| SMPM | SECS message protocol machine | ||
| SMPTE | Society of Motion Picture and Television Engineers | ||
| SMR | Semiconductor mask representation | ||
| SMS | SECS message service; Short Messaging Service | ||
| SMSC | Short Message Switching Center | ||
| SMT | Surface Mount Technology | ||
| SMTA | Surface Mount Technology Association | ||
| SMTP | Simple Mail Transfer Protocol | ||
| SMTS | Strategic Material Transport System | ||
| Sn | Tin | ||
| S/N | Signal-to-noise; Serial number | ||
| SNA | Systems Network Architecture; Scalar Network Analyzer | ||
| SNAP | Selective Niobium Anodization Process | ||
| SNMP | Simple Network Managament Protocol | ||
| SNMS | Sputtered neutral mass spectroscopy | ||
| SNOM | Scanning nearfield optical microscopy | ||
| SNR | Signal-to-Noise Ratio | ||
| SO | Small outline (package) | ||
| SOAP | Simple Object Access Protocol | ||
| SOC | System on (a) Chip | ||
| SOD | Spin-On-Dielectric; Silicon On Diamond; Small Outline Diode; Source Over Drain | ||
| SO DIMM | Small Outline Dual-In-line Memory Module | ||
| SOG | Spin-On Glass; Source Over Gate | ||
| SOI | Silicon On Insulator; Second Order Intercept | ||
| SOIC | Small Outline IC | ||
| SOLT | Short Open Load Through | ||
| SOM | Scanning Optical Microscopy; Sulfuric acid-Ozone Mixture | ||
| SONET | Synchronous Optical NETwork | ||
| SOP | Standard operating procedure; Small outline package | ||
| SOS | Silicon on sapphire | ||
| SOT | Small Outline Transistor | ||
| SOW | Statement Of Work | ||
| SP | Simple Profile | ||
| SP3T | Single Pole Triple Throw | ||
| SPA-LEED | Spot Profile Analysis Low Energy Electron Diffraction | ||
| SPC | Statistical process control; Surface Photoconductivity | ||
| SPDE | Service Provider Delivery Environment | ||
| SPDT | Single Pole Double Throw | ||
| SPEG | Solid Phase Epitaxy Growth | ||
| SPGA | Staggered Pin Grid Array; System Programmable Gate Array | ||
| SPI | Software Process Improvement; Serial-peripheral interface protocol | ||
| SPICE | Simulation program with integrated circuit emphasis | ||
| SPIDER-MEM | SPIDER-Manufacturing Equipment Monitor | ||
| SPIN | Software Process Improvement Network | ||
| SPLD | Simple Programmable Logic Device | ||
| SPLICS | Special-Purpose Linear Integrated Circuits | ||
| SPM | Scanning probe microscopy | ||
| SportsML | Sports Mark-up Language | ||
| SPP | Single-phase printing | ||
| SPR | Semiconductor process representation | ||
| SPS | Surface preparation system | ||
| SPST | Single Pole, Single Throw | ||
| SPT | Shortest processing time | ||
| SPTS | Simple Program Transport Stream | ||
| SPV | Surface Photovoltage Spectroscopy | ||
| SQC | Statistical quality control | ||
| SQUID | Super conducting QUantum Interference Device | ||
| SQL | Structured Query Language | ||
| SQM | System Quality Manager | ||
| SQPMM | Software Quality and Process Maturity Model | ||
| Sr | Strontium | ||
| SR | Shift register | ||
| SRAC | Supplier Relations Action Council | ||
| SRAM | Static random access memory | ||
| SRC | Semiconductor Research Corporation | ||
| SRP | Spreading resistance probe | ||
| SRPT | Shortest remaining processing time | ||
| SRS | Software requirements specification | ||
| SS | Single Sided; Small Signal | ||
| SSA | Semiconductor Industry Association | ||
| SSB | Single Side Band | ||
| SSC | Standard Speech Circuit | ||
| SSE | Sum squared error | ||
| SSEM | Stepper Specific Equipment Model | ||
| SSFDC | Solid-State Floppy-Disk Card | ||
| SSG | Small Signal Gain | ||
| SSH | Secure SHell | ||
| SSI | Small scale integration | ||
| SSL | Secure Socket Layer | ||
| SSM | Strategic Sourcing Methodology | ||
| SSMA | Sub-SMA | ||
| SSOP | Shrink Small Outline Package | ||
| SSPA | Solid State Power Amplifier | ||
| SSQA | Standardized Supplier Quality Assessment | ||
| SSR | Static Shift Register; Solid State Relay | ||
| SSRAM | Synchronous (cache) Static Ramdom Access Memory | ||
| STAF | SDH Transceiver And Framer | ||
| STALO | STAble Local Oscillator | ||
| STAR | Simultaneous transmitted and reflected | ||
| STE | Special Test Equipment | ||
| STEL | Short-term exposure limit | ||
| STEM | Scanning Transmission Electron Microscopy | ||
| STEP | Standard for Exchange of Product Model Data | ||
| STHM | Scanning Thermal Microscope | ||
| STI | Shallow Trench Isolation | ||
| STL | Schottky Transistor Logic | ||
| STM | Scanning Tunneling Microscopy | ||
| STP | Standard Temperature and Pressure; System Test Plan; Shielded Twisted Pair | ||
| SU | Subresolution attenuated | ||
| SUV | Small Unit Verification | ||
| SUT | System under test | ||
| SVD | Singular value decomposition | ||
| SVG | Scalable Vector Graphic | ||
| SWAT | Software Action Team | ||
| SWEAT | Standard wafer-level electromigration accelerated test | ||
| SWI | Static walkthrough/inspection | ||
| SWIM | Semiconductor Workbench for Integrated Modeling | ||
| SWP | Single Wafer Processing | ||
| SWR | Semiconductor Wafer Representation; Standing Wave Ratio | ||
| SWV | Square Wave Voltammetry | ||
| SXPS | Soft X-ray Photoelectron Spectroscopy | ||
| Sync | Synchronous | ||
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