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NEWS NEWS NEWS:            The protype of a new compact thermoreflactance measuring system has been built and is now available for demonstartion.     Please visit the R&D Services section for more details                         NEWS NEWS NEWS:            We are now performing thermal conductivity measurements and temperature measuremnts of active microelectronics using the non-contact, non-destructive thermoreflectance method              
 NETSL: Nanoscale Electro-Thermal Sciences Lab
 

Measurement of Thermal Properties of Thin-Film Electronics Materials and Development and Experimental Validation of Improved Thermal Modeling Techniques of Microelectronics

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Contact Information:

Laboratory Director
Professor Peter E. RAAD
Southern Methodist University
Mechanical Engineering Department
Dallas, TX, 75275-0337 USA


Tel: (214) 768-3866
Fax: (214) 768-4998
e-mail: praad@smu.edu
Personal Web Site

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Right to Know and Other Legal Disclosures


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